Leica STED and confocal

Leica STED and confocal

Location

Nanaline 337

Capabilities

  • Stimulated Emission Depletion super-resolution imaging
  • High sensitivity point scanning confocal with pulsed white light laser
  • High-sensitivity GaAsP HyD detectors with gating and photon counting
  • Spectrally tunable emission bands
  • Resonant scanner for low photo-toxicity
  • Inverted configuration
  • 3D z-stacks, timelapse, stitching, multi-position timelapse

Cost

$35 per hour base rate, discounted for bulk use

Detailed Specifications

Microscope:

  • Leica DMi8 motorized inverted
  • Motorized scanning stage

Lasers:

  • 405 nm Diode laser
  • Argon/2 (458, 488, 514nm)
  • White Light Laser (pulsed) - 470nm-670nm
  • STED depletion lasers: 592nm, 660nm, 775nm

Tandem scanners (select at software initialization)

  • Conventional scanner
  • Resonant scanner (8 000 Hz) - 28 fps at 512*512

Conventional fluorescence filters for eyepiece vizualization:

  • Blue (A = x340-380, dichroic 400, LP425)
  • Green (I3 = xBP470-490, dichroic 510, mLP515)
  • Red (N2.1 = x515-560, dichroic 580, mLP590

Objectives:

  • 10x NA 0.4 HC PL APO dry WD 2.2 mm
  • 20x NA 0.75 HC PL APO multi-Imm Corr (oil, water, glycerol) DIC WD 270 um
  • 40x NA 1.3 oil HC PL APO CS2 OIL DIC WD 240 um
  • 100x/1.4 HCX PL APO OIL DIC WD 90 um
  • 93x NA 1.3 glycerol with motorized correction collar (for STED) WD 0.3mm

Detectors:

  • Five channels - two PMTs, three HyDs - high sensitivity Hybrid Detectors - PMT1 | HyD2 | PMT3 | HyD4 | HyD5
  • All spectral detectors; HyDs have gating for STED

Computer:

  • HP Z840 Workstation
  • Windows 7
  • LAS X
  • Huygens deconvolution software linked to LAS X for STED deconvolution